INTERLAYER STRUCTURE OF THIN SMECTIC FILMS FROM THEIR X-RAY-DIFFRACTION PATTERNS

被引：15
|
作者：
HOLYST, R [1 ]
机构：
[1] UNIV WASHINGTON, DEPT PHYS FM15, SEATTLE, WA 98195 USA
来源：
PHYSICAL REVIEW A | 1990年 / 42卷 / 12期
关键词：
D O I：
10.1103/PhysRevA.42.7511
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The theory of x-ray diffraction for smectic-A films is presented. The effect of the smectic layer fluctuations and correlations and the molecular from factor on the interlayer structure and the x-ray diffraction pattern is discussed. The application of the presented theory to smectic-C, smectic-I, smectic-A(d), and smectic-A2 films is suggested.
引用
收藏
页码：7511 / 7514
页数：4
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