FAILURE MECHANISMS THAT CAUSE HIGH ELECTRICAL LEAKAGE IN MULTILAYER CERAMIC CAPACITORS

被引：1
|
作者：
IKEO, H
SAKAMOTO, S
SATO, K
NISHIURA, H
OHNO, K
机构：
来源：
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY | 1981年 / 8卷 / 3-4期
关键词：
D O I：
10.1155/APEC.8.175
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：175 / 180
页数：6
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