NONDESTRUCTIVE SCREENING FOR LOW-VOLTAGE FAILURE IN MULTILAYER CERAMIC CAPACITORS

被引:3
|
作者
CHITTICK, RC
GRAY, E
ALEXANDER, JH
DRAKE, MP
BUSH, EL
机构
关键词
D O I
10.1109/TCHMT.1983.1136221
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:510 / 516
页数:7
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