GEOMETRICAL AND LIGHT-INDUCED EFFECTS ON BACK-GATING IN ION-IMPLANTED GAAS-MESFETS

被引:24
|
作者
SUBRAMANIAN, S
BHATTACHARYA, PK
STAKER, KJ
GHOSH, CL
BADAWI, MH
机构
[1] STAND TELECOMMUN LABS LTD,HARLOW CM17 9NA,ESSEX,ENGLAND
[2] ITT,GALLIUM ARSENIDE TECHNOL CTR,ROANOKE,VA 24019
关键词
D O I
10.1109/T-ED.1985.21904
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:28 / 33
页数:6
相关论文
共 50 条
  • [31] 0.25-MU-M GATE MILLIMETER-WAVE ION-IMPLANTED GAAS-MESFETS
    WANG, GW
    FENG, M
    LAU, CL
    ITO, C
    LEPKOWSKI, TR
    IEEE ELECTRON DEVICE LETTERS, 1989, 10 (05) : 186 - 188
  • [32] ION INDUCED CHARGE COLLECTION IN GAAS-MESFETS
    CAMPBELL, A
    KNUDSON, A
    MCMORROW, D
    ANDERSON, W
    ROUSSOS, J
    ESPY, S
    BUCHNER, S
    KANG, K
    KERNS, D
    KERNS, S
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) : 2292 - 2299
  • [33] DC PERFORMANCE OF SHORT-CHANNEL ION-IMPLANTED GAAS-MESFETS (THE ROLE OF GATE LENGTH SHORTENING)
    KUZMIK, J
    LALINSKY, T
    MOZOLOVA, Z
    PORGES, M
    SOLID-STATE ELECTRONICS, 1990, 33 (10) : 1223 - 1227
  • [34] 2-DIMENSIONAL SIMULATION OF SUB-MU-M GAAS-MESFETS WITH ION-IMPLANTED DOPING
    FENG, YK
    SCHUNEMANN, K
    SOLID-STATE ELECTRONICS, 1989, 32 (12) : 1719 - 1722
  • [35] ION-IMPLANTATION EFFECTS ON GAAS-MESFETS
    ANHOLT, R
    SIGMON, TW
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (02) : 250 - 255
  • [36] DETERMINATION OF DEEP-LEVEL IMPURITIES AND THEIR EFFECTS ON THE SMALL-SIGNAL AND LF NOISE PROPERTIES OF ION-IMPLANTED GAAS-MESFETS
    SRIRAM, S
    KIM, B
    GHOSH, PK
    DAS, MB
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1982, (63): : 215 - 220
  • [37] KA-BAND MONOLITHIC LOW-NOISE AMPLIFIER USING DIRECT ION-IMPLANTED GAAS-MESFETS
    FENG, M
    SCHERRER, DR
    APOSTOLAKIS, PJ
    MIDDLETON, JR
    MCPARTLIN, MJ
    LAUTERWASSER, BD
    OLIVER, JD
    IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1995, 5 (05): : 156 - 158
  • [38] SELF-ALIGNED SUB-MICRON ION-IMPLANTED GAAS-MESFETS FOR HIGH-SPEED LOGIC
    SADLER, RA
    EASTMAN, LF
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (11) : 1586 - 1587
  • [39] MAPPING OF GAAS AND SI WAFERS AND ION-IMPLANTED LAYERS BY LIGHT-INDUCED SCATTERING AND ABSORPTION OF IR LIGHT
    VAITKUS, J
    GAUBAS, E
    JARASIUNAS, K
    PETRAUSKAS, M
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (1A) : A131 - A134
  • [40] LOW-NOISE MESFETS FOR ION-IMPLANTED GAAS MMICS
    GUPTA, AK
    SIU, DP
    IP, KT
    PETERSEN, WC
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (12) : 1850 - 1854