共 50 条
- [31] MASS SPECTROMETRY OF BACKGROUND GASES IN GLOW-DISCHARGE SPUTTERING OF TANTALUM THIN FILMSJOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1967, 4 (02): : 87 - &SOSNIAK, J
- [32] MASS-SPECTROMETRIC STUDY OF IONIC SPECIES PRESENT DURING OXIDATION OF CO AND DECOMPOSITION OF CO2 IN A RF DISCHARGEJOURNAL OF CHEMICAL PHYSICS, 1974, 61 (02): : 666 - 671BROWN, LCBELL, AT
- [33] AN ION-NEUTRAL SPECIES COLLISION MODEL FOR PARTICLE SIMULATION OF GLOW-DISCHARGEJOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (02) : 324 - 330NANBU, KKITATANI, Y
- [34] STATIC SECONDARY ION MASS-SPECTROMETRIC STUDY OF GLOW-DISCHARGE-IMMOBILIZED PEO SURFACTANT SURFACESABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 205 : 151 - POLYSHEU, MSHOFFMAN, ASRATNER, BDFEIJEN, J
- [35] MASS-SPECTROMETRIC STUDY OF DIELECTRIC IONIZATION IN A SLIDING DISCHARGEPISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1988, 14 (12): : 1132 - 1136GALL, LNDAVYDOV, DNDASHUK, PNKUZMIN, AG
- [36] HIGH-RESOLUTION MASS-SPECTROMETRIC ANALYSIS OF GASES RELEASED FROM GRAPHITE DURING SEQUENTIAL HELIUM AND DEUTERIUM GLOW-DISCHARGE CLEANINGSJOURNAL OF NUCLEAR MATERIALS, 1995, 224 (03) : 293 - 298HIROKI, SHASEGAWA, YKANEKO, KABE, TMURAKAMI, Y
- [37] Correlation between the Relative Sensitivity Factors and the Sputtering Yields in Glow-Discharge Mass SpectrometryAnalytical Sciences, 2000, 16 : 653 - 655Takashi SakaMika Inoue
- [38] MASS-SPECTROMETRIC STUDY OF ELECTRON-BEAM SPUTTERING OF GRAPHITEHIGH TEMPERATURE, 1975, 13 (06) : 1204 - 1205CHAIKOVSKII, EFBATURICHEVA, ZBVLASENKO, VASIVKO, AI
- [39] GLOW-DISCHARGE MASS-SPECTROMETRY OF SILICON DC SPUTTERING IN ARGON-HYDROGENJOURNAL OF PHYSICS D-APPLIED PHYSICS, 1981, 14 (02) : 339 - 346TARDY, JPOITEVIN, JMLEMPERIERE, G
- [40] Reducing the Background Level of a Mass-Spectrometric Hollow Cathode Glow Discharge Ion SourceJournal of Analytical Chemistry, 2003, 58 : 862 - 869G. G. SikharulidzeA. E. Lezhnev