RAMAN-SPECTROSCOPIC STUDY OF NB/ALOX-AL/NB JOSEPHSON-JUNCTIONS

被引：2
|
作者：
MOROHASHI, S
机构：
[1] Fujitsu Laboratories Ltd, Atsugi, 243-01
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1994年 / 33卷 / 2A期
关键词：
NB/ALOX-AL/NB JOSEPHSON JUNCTION; RAMAN SPECTROSCOPY;
D O I：
10.1143/JJAP.33.L170
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have studied the AlOx barrier composition of niobium (Nb) Josephson junctions with a Nb/AlOx-Al/Nb structure using Raman spectroscopy at 10 K. We have observed both Al-O and Al-OH modes of an AlOx barrier with a few nm thickness in the Raman spectra through Nh counter electrode. For a structure annealed at 300 degrees C, the Al-O mode intensity increases and the Al-OH mode intensity decreases. This contributes to a change in the critical current of the junction after annealing.
引用
收藏
页码：L170 / L172
页数：3
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