AN EXPERIMENTAL DETERMINATION OF THE CARRIER LIFETIME IN P-I-N DIODES FROM THE STORED CARRIER CHARGE

被引：43
|
作者：
HOFFMANN, A
SCHUSTER, K
机构：
来源：
SOLID-STATE ELECTRONICS | 1964年 / 7卷 / 10期
关键词：
D O I：
10.1016/0038-1101(64)90028-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：717 / 724
页数：8
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