THE INTERACTION OF HYDROGEN WITH SILICON SURFACES - A FIELD-ION MICROSCOPE AND PULSED-LASER ATOM-PROBE STUDY

被引：7

|

作者：

KELLOGG, GL

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.572349

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：1125 / 1129

页数：5

相关论文

共 50 条

[1] PULSED-LASER ATOM-PROBE AND FIELD-ION MICROSCOPE STUDY OF SOLID-SURFACES
TSONG, TT
LIU, HM
GAO, QJ
REN, DM
LIOU, Y
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05): : 1530 - 1534
[2] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY
KELLOGG, GL
TSONG, TT
JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 1184 - 1193
[3] PULSED-LASER TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE
TSONG, TT
MCLANE, SB
KINKUS, TJ
REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (09): : 1442 - 1448
[4] ATOMIC PROCESSES ON SOLID-SURFACES, A PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPE INVESTIGATION
TSONG, TT
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 33 - ANYL
[5] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY.
Kellog, G.L.
Tsong, T.T.
1600, (51):
[6] ATOMIC STRUCTURES OF SILICON AND METAL-SURFACES - PULSED-LASER TOF ATOM-PROBE AND FIELD-ION MICROSCOPY
TSONG, TT
LIU, HM
GAO, QJ
LIOU, Y
FENG, DL
SURFACE SCIENCE, 1988, 200 (2-3) : 220 - 234
[7] STUDY OF SEMICONDUCTOR SURFACES USING AN ATOM-PROBE FIELD-ION MICROSCOPE .1. HYDROGEN CHEMISORPTION ON SILICON
SAKURAI, T
TSONG, TT
CULBERTSON, RJ
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 647 - 649
[8] ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF SURFACES OF MATERIALS
TSONG, TT
CHEN, CL
LIU, J
JOURNAL OF MATERIALS RESEARCH, 1989, 4 (06) : 1549 - 1559
[9] ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE ON SILICON
KING, RA
MACKENZIE, RAD
SMITH, GDW
CADE, NA
APPLIED SURFACE SCIENCE, 1995, 87-8 (1-4) : 279 - 283
[10] GAS-SURFACE INTERACTION IN ATOM-PROBE FIELD-ION MICROSCOPE
NAKAMURA, S
KURODA, T
JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (04) : 657 - 658

← 1 2 3 4 5 →