ATOMIC STRUCTURES OF SILICON AND METAL-SURFACES - PULSED-LASER TOF ATOM-PROBE AND FIELD-ION MICROSCOPY

被引：3

|

作者：

TSONG, TT

LIU, HM

GAO, QJ

LIOU, Y

FENG, DL

机构：

来源：

SURFACE SCIENCE | 1988年 / 200卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(88)90523-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：220 / 234

页数：15

相关论文

共 50 条

[1] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY
KELLOGG, GL
TSONG, TT
JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 1184 - 1193
[2] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY.
Kellog, G.L.
Tsong, T.T.
1600, (51):
[3] ATOMIC-STRUCTURE AND COMPOSITIONAL ANALYSIS OF SOLID-SURFACES USING PULSED-LASER TOF ATOM-PROBE AND FIELD-ION MICROSCOPY
TSONG, TT
APPLIED SURFACE SCIENCE, 1988, 33-4 : 15 - 20
[4] THE INTERACTION OF HYDROGEN WITH SILICON SURFACES - A FIELD-ION MICROSCOPE AND PULSED-LASER ATOM-PROBE STUDY
KELLOGG, GL
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 1125 - 1129
[5] ATOMIC PROCESSES ON SOLID-SURFACES, A PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPE INVESTIGATION
TSONG, TT
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 33 - ANYL
[6] PULSED-LASER ATOM-PROBE AND FIELD-ION MICROSCOPE STUDY OF SOLID-SURFACES
TSONG, TT
LIU, HM
GAO, QJ
REN, DM
LIOU, Y
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05): : 1530 - 1534
[7] PULSED-LASER TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE
TSONG, TT
MCLANE, SB
KINKUS, TJ
REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (09): : 1442 - 1448
[8] ATOM-PROBE FIELD-ION MICROSCOPY
LEISCH, M
MIKROCHIMICA ACTA, 1992, 107 (3-6) : 95 - 104
[9] ATOM-PROBE FIELD-ION MICROSCOPY
MULLER, EW
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01): : 89 - &
[10] ATOM-PROBE FIELD-ION MICROSCOPY
MILLER, MK
VACUUM, 1994, 45 (6-7) : 819 - 831

← 1 2 3 4 5 →