CHARACTERIZATION OF MICROSTRUCTURE IN ION-IMPLANTED GARNET BY TRANSMISSION ELECTRON-MICROSCOPY

被引:6
|
作者
YOSHIIE, T
BAUER, CL
KRYDER, MH
机构
关键词
D O I
10.1109/TMAG.1983.1062709
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:1823 / 1825
页数:3
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