CHARACTERIZATION OF MICROSTRUCTURE IN ION-IMPLANTED GARNET BY TRANSMISSION ELECTRON-MICROSCOPY

被引:6
|
作者
YOSHIIE, T
BAUER, CL
KRYDER, MH
机构
关键词
D O I
10.1109/TMAG.1983.1062709
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
下载
收藏
页码:1823 / 1825
页数:3
相关论文
共 50 条
  • [1] INVESTIGATION OF AMORPHIZATION AND CRYSTALLIZATION PROCESSES IN ION-IMPLANTED GARNET BY TRANSMISSION ELECTRON-MICROSCOPY
    YOSHIIE, T
    BAUER, CL
    KRYDER, MH
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (06) : 2155 - 2160
  • [2] PREPARATION OF ION-IMPLANTED SILICON FOR TRANSMISSION ELECTRON-MICROSCOPY
    OHLIDAL, M
    OREL, V
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1974, B 24 (04) : 349 - +
  • [3] HEATPULSE ANNEALING OF ION-IMPLANTED SILICON - STRUCTURAL CHARACTERIZATION BY TRANSMISSION ELECTRON-MICROSCOPY
    SADANA, DK
    SHATAS, SC
    GAT, A
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (67): : 143 - 148
  • [4] TRANSMISSION ELECTRON-MICROSCOPY STUDY OF SI ION-IMPLANTED GAAS
    HUGHES, B
    NARAYANAN, GH
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (03) : C119 - C119
  • [5] EXAMINATION OF TELLURIUM ION-IMPLANTED GAAS BY TRANSMISSION ELECTRON-MICROSCOPY
    SEALY, BJ
    JOURNAL OF MATERIALS SCIENCE, 1975, 10 (04) : 683 - 691
  • [6] TRANSMISSION ELECTRON-MICROSCOPY OF SELF-ANNEALED ION-IMPLANTED SILICON
    GABILLI, E
    LOTTI, R
    LULLI, G
    MERLI, PG
    ANTISARI, MV
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (01): : L14 - L16
  • [7] A TRANSMISSION ELECTRON-MICROSCOPY STUDY OF XENON BUBBLES IN ION-IMPLANTED TIN
    MITCHELL, DRG
    DONNELLY, SE
    EVANS, JH
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1990, 61 (04): : 531 - 542
  • [8] INTERFERENCE ELECTRON-MICROSCOPY OF ION-IMPLANTED DIODES
    KRIMMEL, EF
    MERLI, PG
    MISSIROLI, GF
    OPPOLZER, H
    VANZI, M
    ULTRAMICROSCOPY, 1980, 5 (03) : 380 - 381
  • [9] MICROSTRUCTURAL INVESTIGATION OF ION-IMPLANTED TITANIUM-ALLOYS BY TRANSMISSION ELECTRON-MICROSCOPY
    RAJAN, K
    PATNAIK, PC
    ELDER, JE
    THAMBURAJ, R
    JOURNAL OF METALS, 1987, 39 (07): : A18 - A18
  • [10] INVESTIGATION OF ION-IMPLANTED LAYERS BY SCANNING ELECTRON-MICROSCOPY
    ROTHEMUND, W
    FRITZSCHE, CR
    APPLIED PHYSICS, 1976, 10 (02): : 111 - 119