DIAPHRAGM THICKNESS CONTROL IN SILICON PRESSURE SENSORS USING AN ANODIC-OXIDATION ETCH-STOP

被引:24
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作者
HIRATA, M
SUWAZONO, S
TANIGAWA, H
机构
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D O I
10.1149/1.2100814
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:2037 / 2041
页数:5
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