INSITU X-RAY-DIFFRACTION OF ELECTRODE MATERIALS

被引：0

|

作者：

NAZRI, G ^{[1
]}

机构：

[1] GM CORP,RES LAB,DEPT PHYS CHEM,WARREN,MI 48090

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1988年 / 135卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

收藏

页码：C144 / C144

页数：1

相关论文

共 50 条

[21] X-RAY-DIFFRACTION
SMITH, DK
SMITH, KL
[J]. ANALYTICAL CHEMISTRY, 1980, 52 (05) : R122 - R131
[22] X-RAY-DIFFRACTION NDE TECHNOLOGY FOR MATERIALS PROCESSING
RUUD, CO
[J]. JOURNAL OF METALS, 1988, 40 (11): : 124 - 124
[23] CHARACTERIZATION OF ELECTRONIC MATERIALS BY SYNCHROTRON X-RAY-DIFFRACTION
MATSUI, J
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8B) : C456 - C456
[24] STRESS MEASUREMENT IN POLYMERIC MATERIALS BY X-RAY-DIFFRACTION
BARRETT, CS
PREDECKI, P
[J]. POLYMER ENGINEERING AND SCIENCE, 1976, 16 (09): : 602 - 608
[25] MICROBEAM X-RAY-DIFFRACTION IN THE ANALYSIS OF MINERALS AND MATERIALS
WICKS, FJ
CORBEIL, MC
BACK, ME
RAMIK, RA
[J]. CANADIAN MINERALOGIST, 1995, 33 : 313 - 322
[26] X-RAY-DIFFRACTION
PFLUGER, CE
[J]. ANALYTICAL CHEMISTRY, 1972, 44 (05) : R563 - &
[27] X-RAY-DIFFRACTION FOR NONDESTRUCTIVE CHARACTERIZATION OF POLYCRYSTALLINE MATERIALS
RUUD, CO
WEEDMAN, SD
[J]. NONDESTRUCTIVE MONITORING OF MATERIALS PROPERTIES, 1989, 142 : 71 - 76
[28] MAGNIFICATION IN X-RAY-DIFFRACTION PATTERNS OF POLYCRYSTALLINE MATERIALS
GOPALAKRISHNA, G
RAMCHANDER, RB
[J]. INTERNATIONAL JOURNAL OF ROCK MECHANICS AND MINING SCIENCES, 1973, 10 (04) : 285 - 289
[29] X-RAY-DIFFRACTION
PFLUGER, CE
[J]. ANALYTICAL CHEMISTRY, 1974, 46 (05) : R469 - R478
[30] X-RAY-DIFFRACTION
SAGURTON, JR
GIORDANO, J
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (01): : 102 - 102

← 1 2 3 4 5 →