X-RAY-DIFFRACTION FOR NONDESTRUCTIVE CHARACTERIZATION OF POLYCRYSTALLINE MATERIALS

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作者：

RUUD, CO

WEEDMAN, SD

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NONDESTRUCTIVE MONITORING OF MATERIALS PROPERTIES | 1989年 / 142卷

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TQ174 [陶瓷工业]; TB3 [工程材料学];

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0805 ; 080502 ;

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页码：71 / 76

页数：6

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