COST-ANALYSIS, AVAILABILITY AND MTTF OF A 3 STATE STANDBY COMPLEX SYSTEM UNDER COMMON-CAUSE AND HUMAN FAILURES

被引：11

作者：

PANDEY, D

JACOB, M

机构：

[1] Department of Mathematics, Meerut University, Meerut

来源：

MICROELECTRONICS AND RELIABILITY | 1995年 / 35卷 / 01期

关键词：

D O I：

10.1016/0026-2714(93)E0019-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper deals with the pointwise availability, steady state availability, MTTF and variance of the time to failure of 3 state, 1-out-of-2 unit systems with cold standby, under common cause and human failures. The cost function analysis is also done to get the expected gain over the time. Several graphs are presented to interpret the results.

引用

页码：91 / 95

页数：5

共 50 条

[21] COST-ANALYSIS OF A 2 UNIT, 3 STATE STANDBY REDUNDANT COMPLEX SYSTEM WITH 2 TYPES OF REPAIR FACILITIES UNDER WAITING
GUPTA, PP
SINGHAL, A
SHARMA, RK
[J]. MICROELECTRONICS AND RELIABILITY, 1987, 27 (06): : 959 - 963
[22] STOCHASTIC-ANALYSIS OF A PARALLEL SYSTEM WITH COMMON-CAUSE FAILURES AND CRITICAL HUMAN ERRORS
DHILLON, BS
[J]. MICROELECTRONICS AND RELIABILITY, 1989, 29 (04): : 627 - 637
[23] MODELING COMMON-CAUSE FAILURES UNDER DATA UNCERTAINTY OF THE SYSTEM UNAVAILABILITY
KULKARNI, RN
[J]. MICROELECTRONICS RELIABILITY, 1994, 34 (10) : 1615 - 1622
[24] COMMON-CAUSE FAILURE ANALYSIS OF A 3-STATE DEVICE SYSTEM
DHILLON, BS
SAMBHI, A
KHAN, MR
[J]. MICROELECTRONICS AND RELIABILITY, 1979, 19 (04): : 345 - 348
[25] K-OUT-OF-N 3-STATE DEVICES SYSTEM WITH COMMON-CAUSE FAILURES
DHILLON, BS
[J]. MICROELECTRONICS AND RELIABILITY, 1978, 18 (05): : 447 - 448
[26] AN AVAILABILITY CALCULATION FOR K-OUT-OF-N REDUNDANT SYSTEM WITH COMMON-CAUSE FAILURES AND REPLACEMENT
CHUNG, WK
[J]. MICROELECTRONICS AND RELIABILITY, 1980, 20 (04): : 517 - 519
[27] MTTF AND AVAILABILITY EVALUATION OF A 2-UNIT, 2-STATE, STANDBY REDUNDANT COMPLEX SYSTEM WITH CONSTANT HUMAN FAILURE
GUPTA, PP
TYAGI, L
[J]. MICROELECTRONICS AND RELIABILITY, 1986, 26 (04): : 647 - 650
[28] PROBABILISTIC ANALYSIS OF REDUNDANT-SYSTEMS WITH HUMAN ERRORS AND COMMON-CAUSE FAILURES
DHILLON, BS
RAYAPATI, SN
[J]. STOCHASTIC ANALYSIS AND APPLICATIONS, 1986, 4 (04) : 367 - 398
[29] AVAILABILITY OF THE CRYSTALLIZATION SYSTEM IN THE SUGAR-INDUSTRY UNDER COMMON-CAUSE FAILURE
KUMAR, D
SINGH, J
PANDEY, PC
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1992, 41 (01) : 85 - 91
[30] COST-ANALYSIS OF A 3-STATE STANDBY REDUNDANT ELECTRONIC EQUIPMENT
GUPTA, PP
SHARMA, RK
[J]. MICROELECTRONICS AND RELIABILITY, 1985, 25 (06): : 1029 - 1033

← 1 2 3 4 5 →