MTTF AND AVAILABILITY EVALUATION OF A 2-UNIT, 2-STATE, STANDBY REDUNDANT COMPLEX SYSTEM WITH CONSTANT HUMAN FAILURE

被引：5

|

作者：

GUPTA, PP

TYAGI, L

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1986年 / 26卷 / 04期

关键词：

D O I：

10.1016/0026-2714(86)90009-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：647 / 650

页数：4

相关论文

共 50 条

[1] MTTF AND AVAILABILITY EVALUATION OF A 2-UNIT, 2-STATE, PARALLEL REDUNDANT COMPLEX SYSTEM WITH CONSTANT HUMAN FAILURE
GUPTA, PP
KUMAR, A
MICROELECTRONICS AND RELIABILITY, 1986, 26 (01): : 53 - 56
[2] 2-UNIT STANDBY REDUNDANT SYSTEM WITH STANDBY FAILURE
OSAKI, S
NAKAGAWA, T
OPERATIONS RESEARCH, 1971, 19 (02) : 510 - &
[3] SWITCH FAILURE IN A 2-UNIT STANDBY REDUNDANT SYSTEM
GUPTA, SM
JAISWAL, NK
GOEL, LR
MICROELECTRONICS AND RELIABILITY, 1983, 23 (01): : 129 - 132
[4] RELIABILITY OF A 2-UNIT STANDBY REDUNDANT SYSTEM WITH REPAIR, MAINTENANCE AND STANDBY FAILURE
SUBRAMANIAN, R
VENKATAKRISHNAN, KS
IEEE TRANSACTIONS ON RELIABILITY, 1975, R 24 (02) : 139 - 142
[5] A NOTE ON A 2-UNIT STANDBY REDUNDANT SYSTEM
OSAKI, S
JOURNAL OF THE OPERATIONS RESEARCH SOCIETY OF JAPAN, 1970, 12 (02) : 43 - &
[6] POINT-WISE AVAILABILITY OF A 2-UNIT STANDBY REDUNDANT ELECTRONIC EQUIPMENT UNDER HUMAN FAILURE
GUPTA, PP
KUMAR, A
MICROELECTRONICS AND RELIABILITY, 1986, 26 (02): : 225 - 228
[7] AVAILABILITY OF A 2-UNIT COLD-STANDBY SYSTEM WITH DEGRADED STATE
LESANOVSKY, A
IEEE TRANSACTIONS ON RELIABILITY, 1982, 31 (01) : 123 - 123
[8] MTTF AND AVAILABILITY EVALUATION OF A 2 UNIT, 3 STATE REDUNDANT SYSTEM WITH A PROVISO OF RANDOM ACTIVATION
SINGH, SK
SINGH, RP
SINGH, RB
MICROELECTRONICS AND RELIABILITY, 1992, 32 (10): : 1443 - 1452
[9] ON THE APPLICATIONS OF PHASE TYPE DISTRIBUTION TO A COMPLEX 2-UNIT STANDBY REDUNDANT SYSTEM
GURURAJAN, M
NATARAJAN, R
CHANDRASEKHAR, P
MICROELECTRONICS RELIABILITY, 1986, 26 (03) : 443 - 446
[10] AVAILABILITY ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM
SUBRAMANIAN, R
NATARAJAN, R
IEEE TRANSACTIONS ON RELIABILITY, 1980, 29 (02) : 182 - 183

← 1 2 3 4 5 →