COST-ANALYSIS, AVAILABILITY AND MTTF OF A 3 STATE STANDBY COMPLEX SYSTEM UNDER COMMON-CAUSE AND HUMAN FAILURES

被引：11

作者：

PANDEY, D

JACOB, M

机构：

[1] Department of Mathematics, Meerut University, Meerut

来源：

MICROELECTRONICS AND RELIABILITY | 1995年 / 35卷 / 01期

关键词：

D O I：

10.1016/0026-2714(93)E0019-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper deals with the pointwise availability, steady state availability, MTTF and variance of the time to failure of 3 state, 1-out-of-2 unit systems with cold standby, under common cause and human failures. The cost function analysis is also done to get the expected gain over the time. Several graphs are presented to interpret the results.

引用

页码：91 / 95

页数：5

共 50 条

[1] RELIABILITY AND AVAILABILITY ANALYSIS OF A SYSTEM WITH WARM STANDBY AND COMMON-CAUSE FAILURES
DHILLON, BS
[J]. MICROELECTRONICS AND RELIABILITY, 1993, 33 (09): : 1343 - 1349
[2] AVAILABILITY, MTTF AND COST-ANALYSIS OF A 3-STATE PARALLEL REDUNDANT MULTICOMPONENT SYSTEM UNDER CRITICAL HUMAN FAILURES
ELIAS, SS
HAGGAG, MY
[J]. MICROELECTRONICS AND RELIABILITY, 1992, 32 (12): : 1741 - 1761
[3] RELIABILITY AND AVAILABILITY ANALYSIS OF WARM STANDBY SYSTEMS WITH COMMON-CAUSE FAILURES AND HUMAN ERRORS
DHILLON, BS
YANG, N
[J]. MICROELECTRONICS AND RELIABILITY, 1992, 32 (04): : 561 - 575
[4] STOCHASTIC-ANALYSIS OF STANDBY SYSTEMS WITH COMMON-CAUSE FAILURES AND HUMAN ERRORS
DHILLON, BS
YANG, NF
[J]. MICROELECTRONICS AND RELIABILITY, 1992, 32 (12): : 1699 - 1712
[5] AVAILABILITY ANALYSIS OF A REPAIRABLE SYSTEM WITH COMMON-CAUSE FAILURE AND ONE STANDBY UNIT
MAHMOUD, M
MOKHLES, MA
SALEH, EH
[J]. MICROELECTRONICS AND RELIABILITY, 1987, 27 (04): : 741 - 754
[6] Reliability analysis of a complex system with a deteriorating standby unit under common-cause failure and critical human error
Narmada, S
Jacob, M
[J]. MICROELECTRONICS AND RELIABILITY, 1996, 36 (09): : 1287 - 1290
[7] RELIABILITY-ANALYSIS OF A REPAIRABLE PARALLEL SYSTEM WITH STANDBY INVOLVING HUMAN ERROR AND COMMON-CAUSE FAILURES
CHUNG, WK
[J]. MICROELECTRONICS AND RELIABILITY, 1987, 27 (02): : 269 - 271
[8] AVAILABILITY AND MTTF ANALYSIS OF A 3-STATE PARALLEL REDUNDANT MULTICOMPONENT SYSTEM UNDER CRITICAL HUMAN FAILURES
GUPTA, PP
SHARMA, RK
[J]. MICROELECTRONICS AND RELIABILITY, 1986, 26 (01): : 63 - 68
[9] Availability analysis of a generalized maintainable three-state device parallel system with human error and common-cause failures
Dhillon, B.
Shah, Aashish
[J]. JOURNAL OF QUALITY IN MAINTENANCE ENGINEERING, 2007, 13 (04) : 411 - +
[10] AVAILABILITY AND FREQUENCY OF FAILURES OF A SYSTEM IN THE PRESENCE OF CHANCE COMMON-CAUSE SHOCK FAILURES
VERMA, SM
CHARI, AA
[J]. MICROELECTRONICS AND RELIABILITY, 1991, 31 (2-3): : 265 - 269

← 1 2 3 4 5 →