共 34 条
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- [2] COST-ANALYSIS OF A 3-STATE PARALLEL REDUNDANT COMPLEX SYSTEM [J]. MICROELECTRONICS AND RELIABILITY, 1985, 25 (06): : 1021 - 1027
- [3] RELIABILITY AND MTTF ANALYSIS OF A 3-STATE MULTICOMPONENT PARALLEL REDUNDANT SYSTEM UNDER OVERLOADING EFFECT AND WAITING [J]. MICROELECTRONICS AND RELIABILITY, 1990, 30 (05): : 861 - 864
- [4] COST-ANALYSIS OF A 3-STATE REPAIRABLE REDUNDANT COMPLEX SYSTEM UNDER VARIOUS MODES OF FAILURES [J]. MICROELECTRONICS AND RELIABILITY, 1986, 26 (01): : 69 - 73
- [5] COST-ANALYSIS, AVAILABILITY AND MTTF OF A 3 STATE STANDBY COMPLEX SYSTEM UNDER COMMON-CAUSE AND HUMAN FAILURES [J]. MICROELECTRONICS AND RELIABILITY, 1995, 35 (01): : 91 - 95
- [6] COST-ANALYSIS OF A MULTICOMPONENT PARALLEL REDUNDANT COMPLEX SYSTEM WITH OVERLOADING EFFECT AND WAITING UNDER CRITICAL HUMAN ERROR [J]. MICROELECTRONICS AND RELIABILITY, 1991, 31 (05): : 865 - 868
- [7] AVAILABILITY AND MTTF ANALYSIS OF A 3 STATE REPAIRABLE REDUNDANT ELECTRONIC EQUIPMENT UNDER CRITICAL HUMAN ERRORS [J]. MICROELECTRONICS AND RELIABILITY, 1986, 26 (01): : 57 - 62
- [8] COST-ANALYSIS OF A 3-STATE STANDBY REDUNDANT ELECTRONIC EQUIPMENT [J]. MICROELECTRONICS AND RELIABILITY, 1985, 25 (06): : 1029 - 1033
- [9] RELIABILITY AND MTTF ANALYSIS OF A NON REPAIRABLE PARALLEL REDUNDANT COMPLEX SYSTEM UNDER HARDWARE AND HUMAN FAILURES [J]. MICROELECTRONICS AND RELIABILITY, 1986, 26 (02): : 229 - 234
- [10] COST-ANALYSIS OF A 3-STATE 2-UNIT REPARABLE SYSTEM [J]. MICROELECTRONICS AND RELIABILITY, 1984, 24 (01): : 55 - 59