GRAPH-OPTIMIZATION TECHNIQUES FOR IC LAYOUT AND COMPACTION

被引:21
|
作者
KEDEM, G [1 ]
WATANABE, H [1 ]
机构
[1] UNIV ROCHESTER,DEPT COMP SCI,ROCHESTER,NY 14627
关键词
D O I
10.1109/TCAD.1984.1270052
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:12 / 20
页数:9
相关论文
共 50 条
  • [31] Removing Node Overlapping in Graph Layout Using Constrained Optimization
    Kim Marriott
    Peter Stuckey
    Vincent Tam
    Weiqing He
    Constraints, 2003, 8 : 143 - 171
  • [32] GraphOptima: A graph layout optimization framework for visualizing large networks
    Gruzd, Anatoliy
    Zhang, Jingwei
    Mai, Philip
    SoftwareX, 2025, 29
  • [33] Removing node overlapping in graph layout using constrained optimization
    Marriott, K
    Stuckey, P
    Tam, V
    He, WQ
    CONSTRAINTS, 2003, 8 (02) : 143 - 171
  • [34] A Critical Survey of the Existing Stope Layout Optimization Techniques
    M. Ataee-pour
    Journal of Mining Science, 2005, 41 : 447 - 466
  • [35] A critical survey of the existing stope layout optimization techniques
    Ataee-Pour, M
    JOURNAL OF MINING SCIENCE, 2005, 41 (05) : 447 - 466
  • [36] Edge based layout compaction
    Chen, SL
    He, XQ
    Yang, ZL
    2001 4TH INTERNATIONAL CONFERENCE ON ASIC PROCEEDINGS, 2001, : 198 - 201
  • [37] ADVANCES IN HOMOTOPIC LAYOUT COMPACTION
    GAO, S
    KAUFMANN, M
    MALEY, FM
    SPAA 89: PROCEEDINGS OF THE 1989 ACM SYMPOSIUM ON PARALLEL ALGORITHMS AND ARCHITECTURES, 1989, : 273 - 282
  • [38] A survey of two-dimensional graph layout techniques for information visualisation
    Gibson, Helen
    Faith, Joe
    Vickers, Paul
    INFORMATION VISUALIZATION, 2013, 12 (3-4) : 324 - 357
  • [39] Selection and Basis of Optimization Criteria Associated with the Layout of MOS-IC Layout Using Dynamic Logic.
    Tabarnyi, V.G.
    Logvinenko, N.P.
    Stolyarov, E.Ya.
    Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika, 1975, 18 (12): : 72 - 76
  • [40] Design for manufacturability: IC layout density optimization by minimum-variance method
    Lin, Sheng-Che
    Doong, Kelvin Yih-Yuh
    Chen, Fei-Long
    JOURNAL OF INDUSTRIAL AND PRODUCTION ENGINEERING, 2010, 27 (04) : 281 - 293