WEAK-BEAM ELECTRON-MICROSCOPY OF RADIATION-INDUCED SEGREGATION

被引：3
|
作者：
SAKA, H
机构：
来源：
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1983年 / 48卷 / 02期
关键词：
D O I：
10.1080/01418618308244312
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：239 / 250
页数：12
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