WEAK-BEAM ELECTRON-MICROSCOPY OF RADIATION-INDUCED SEGREGATION

被引：3
|
作者：
SAKA, H
机构：
来源：
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1983年 / 48卷 / 02期
关键词：
D O I：
10.1080/01418618308244312
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：239 / 250
页数：12
相关论文
共 50 条
  • [31] THE USE OF SUPERLATTICE REFLECTIONS FOR WEAK-BEAM MICROSCOPY
    NGAN, AHW
    JONES, IP
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1993, 68 (03): : 525 - 535
  • [32] STUDY OF GUINIER-PRESTON ZONES IN ALUMINUM-COPPER ALLOYS USING WEAK-BEAM TECHNIQUE OF ELECTRON-MICROSCOPY
    YOSHIDA, H
    COCKAYNE, DJH
    WHELAN, MJ
    PHILOSOPHICAL MAGAZINE, 1976, 34 (01): : 89 - 100
  • [33] RADIATION-INDUCED CORROSION OF WET CDS POWDERS MONITORED BY TRANSMISSION ELECTRON-MICROSCOPY
    SABATE, J
    AGUADO, MA
    ESCUDERO, JC
    GIMENEZ, J
    SIMARRO, R
    CERVERAMARCH, S
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1990, 140 (01) : 35 - 40
  • [34] Weak-beam scanning transmission electron microscopy for quantitative dislocation density measurement in steels
    Yoshida, Kenta
    Shimodaira, Masaki
    Toyama, Takeshi
    Shimizu, Yasuo
    Inoue, Koji
    Yoshiie, Toshimasa
    Milan, Konstantinovic J.
    Gerard, Robert
    Nagai, Yasuyoshi
    MICROSCOPY, 2017, 66 (02) : 120 - 130
  • [35] The benefits of energy-filtering in weak-beam microscopy
    Jenkins, ML
    Martin, SP
    Hetherington, CJD
    Kirk, MA
    ELECTRON MICROSCOPY: ITS ROLE IN MATERIALS SCIENCE: THE MIKE MESHII SYMPOSIUM, 2003, : 13 - 24
  • [36] ELECTRON-MICROSCOPIC STUDY ON RADIATION-DAMAGE USING WEAK-BEAM METHOD
    HAUSSERM.F
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1972, 135 (5-6): : 467 - &
  • [37] SCANNING ELECTRON-MICROSCOPY USING BEAM INDUCED CURRENTS
    GULDBERG, J
    SCANDINAVIAN JOURNAL OF METALLURGY, 1977, 6 (01) : 9 - 9
  • [38] OBSERVATION OF RADIATION-INDUCED DEFECT FORMATION IN ALUMINUM BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
    HOWE, JM
    SARIKAYA, M
    CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS, 1989, 138 : 41 - 45
  • [39] A study on crystal defects in epitaxial GaN film by high-order weak-beam electron microscopy
    Wang, SQ
    Liu, CP
    Ye, HQ
    MATERIALS CHARACTERIZATION, 2000, 44 (4-5) : 385 - 389
  • [40] Weak-beam transmission electron microscopy study of dislocation accommodation processes in nickel Σ=3 grain boundaries
    Poulat, S
    Decamps, B
    Priester, L
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1998, 77 (06): : 1381 - 1397
12345