WEAK-BEAM ELECTRON-MICROSCOPY OF RADIATION-INDUCED SEGREGATION

被引：3

作者：

SAKA, H

机构：

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1983年 / 48卷 / 02期

关键词：

D O I：

10.1080/01418618308244312

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：239 / 250

页数：12

共 50 条

[1] WEAK-BEAM ELECTRON-MICROSCOPY
COCKAYNE, DJH
ANNUAL REVIEW OF MATERIALS SCIENCE, 1981, 11 : 75 - 95
[2] WEAK-BEAM METHOD IN ELECTRON-MICROSCOPY
ARMIGLIA.A
VALDRE, U
JOURNAL OF SUBMICROSCOPIC CYTOLOGY, 1972, 4 (01): : 128 - &
[3] PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
COCKAYNE, DJ
JOURNAL OF MICROSCOPY, 1973, 98 (JUL) : 116 - 134
[4] DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
COCKAYNE, DJH
HONS, A
JOURNAL DE PHYSIQUE, 1979, 40 : 11 - 18
[5] THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
COCKAYNE, DJ
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 452 - +
[6] WEAK-BEAM ELECTRON-MICROSCOPY OF FAULTED DIPOLES IN DEFORMED SILICON
WINTER, AT
MAHAJAN, S
BRASEN, D
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 37 (03): : 315 - 326
[7] WEAK-BEAM TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF DISLOCATION PROCESSES IN INTERMETALLICS
VEYSSIERE, P
ISIJ INTERNATIONAL, 1991, 31 (10) : 1028 - 1048
[8] STUDY OF FAULTED DIPOLES IN COPPER USING WEAK-BEAM ELECTRON-MICROSCOPY
CARTER, CB
HOLMES, SM
PHILOSOPHICAL MAGAZINE, 1975, 32 (03): : 599 - 614
[9] INTERACTION OF THICKNESS EXTINCTION CONTOURS AND DISLOCATIONS IN WEAK-BEAM ELECTRON-MICROSCOPY
SCHAPINK, FW
ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S262 - S262
[10] WEAK-BEAM ELECTRON-MICROSCOPY OF NEARLY TRANSVERSE GRAIN-BOUNDARIES
SCHAPINK, FW
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 38 (02): : K107 - &

← 1 2 3 4 5 →