USE OF INDEX OF REFRACTION LIQUIDS FOR THE MEASUREMENT OF THE REFRACTIVE INDEX OF THIN TRANSPARENT FILMS ON SILICON

被引：12
|
作者：
LEWIS, AE
机构：
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1964年 / 111卷 / 08期
关键词：
D O I：
10.1149/1.2426283
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
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页码：1007 / 1009
页数：3
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