TESTING VLSI COMPONENTS

被引：0

作者：

HUTCHESON, JD ^{[1
]}

机构：

[1] VLSI RES INC,SAN JOSE,CA

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暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：79 / 79

页数：1

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