CORRELATION BETWEEN EBIC CONTRASTS AND CRYSTALLOGRAPHIC STRUCTURE OF GRAIN-BOUNDARIES IN SILICON

被引：11

作者：

DIANTEILL, C

ROCHER, A

机构：

来源：

JOURNAL DE PHYSIQUE | 1982年 / 43卷 / NC1期

关键词：

D O I：

10.1051/jphyscol:1982111

中图分类号：

学科分类号：

摘要：

引用

页码：75 / 82

页数：8

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