CORRELATION BETWEEN EBIC CONTRASTS AND CRYSTALLOGRAPHIC STRUCTURE OF GRAIN-BOUNDARIES IN SILICON

被引：11
|
作者：
DIANTEILL, C
ROCHER, A
机构：
来源：
JOURNAL DE PHYSIQUE | 1982年 / 43卷 / NC1期
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D O I：
10.1051/jphyscol:1982111
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页码：75 / 82
页数：8
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