HIGH THROUGHPUT MULTILAYER MIRROR BASED SOFT-X-RAY SPECTROMETER FOR METALLIC IMPURITY EMISSION FROM TOKAMAKS

被引：6

作者：

ZWICKER, AP ^{[1
]}

REGAN, SP ^{[1
]}

FINKENTHAL, M ^{[1
]}

MOOS, HW ^{[1
]}

机构：

[1] HEBREW UNIV JERUSALEM,RACAH INST PHYS,JERUSALEM,ISRAEL

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 10期

关键词：

D O I：

10.1063/1.1141831

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B4C MLM that has a reflectivity of 20-30% and a bandpass of 4-9 Å (FWHM), the instrument has a wavelength range of 90-180 Å. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.

引用

页码：2786 / 2788

页数：3

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