HIGH THROUGHPUT MULTILAYER MIRROR BASED SOFT-X-RAY SPECTROMETER FOR METALLIC IMPURITY EMISSION FROM TOKAMAKS

被引：6
|
作者：
ZWICKER, AP [1 ]
REGAN, SP [1 ]
FINKENTHAL, M [1 ]
MOOS, HW [1 ]
机构：
[1] HEBREW UNIV JERUSALEM,RACAH INST PHYS,JERUSALEM,ISRAEL
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 10期
关键词：
D O I：
10.1063/1.1141831
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B4C MLM that has a reflectivity of 20-30% and a bandpass of 4-9 Å (FWHM), the instrument has a wavelength range of 90-180 Å. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.
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页码：2786 / 2788
页数：3
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