共 13 条
- [1] SLOW RELAXATION OF THE NONEQUILIBRIUM CONDUCTIVITY OF SURFACE-BARRIER SEMICONDUCTOR STRUCTURES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1984, 18 (08): : 941 - 942
- [2] SLOW RELAXATION OF THE NONEQUILIBRIUM CONDUCTIVITY OF SURFACE-BARRIER SEMICONDUCTOR STRUCTURES. Soviet physics. Semiconductors, 1984, 18 (08): : 941 - 942
- [3] CRITICAL-CURRENT RELAXATION IN CERAMIC SUPERCONDUCTORS - EFFECT OF THE SURFACE-BARRIER PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 1995, 251 (3-4): : 307 - 314
- [4] METHOD FOR DETERMINATION OF PARAMETERS OF IMPURITY CENTERS IN A SEMICONDUCTOR FROM RELAXATION OF REVERSE CURRENT IN SURFACE-BARRIER STRUCTURES AS APPLIED TO GAAS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1973, 6 (12): : 2003 - 2006
- [6] TUNNEL-TYPE CURRENT IN SURFACE-BARRIER STRUCTURES MADE OF LIGHTLY DOPED GALLIUM-ARSENIDE SOVIET PHYSICS SEMICONDUCTORS-USSR, 1990, 24 (12): : 1298 - 1300
- [7] Room temperature spectroscopy of deep levels in junction structures using barrier capacitance charging current transients JOURNAL OF INSTRUMENTATION, 2012, 7
- [8] Experimental equipment to investigate deep energy levels in semiconductor barrier structures with high leakage current 13TH INTERNATIONAL CONFERENCE ON ELEKTRO (ELEKTRO 2020), 2020,
- [9] DETERMINATION OF THE PARAMETERS OF DEEP LEVELS IN EPITAXIAL GAP-ZN-O FILMS BY FABRICATION OF DOUBLE SURFACE-BARRIER DIODES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1981, 15 (08): : 965 - 966
- [10] MECHANISM OF FLOW OF DIRECT-CURRENT IN GAAS SURFACE-BARRIER STRUCTURES (NONDEGENERATE ELECTRON-GAS CASE) SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 9 (03): : 337 - 340