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- [21] LOW-ENERGY AUGER-ELECTRON SPECTROSCOPY OF VANADIUM NITRIDESSURFACE SCIENCE, 1990, 234 (03) : 339 - 354DAWSON, PTTZATZOV, KK
- [22] STUDIES OF ACETYLENE AND OXYGEN-ADSORPTION ON SILICON SURFACES BY LOW-ENERGY ELECTRON LOSS SPECTROSCOPYSURFACE SCIENCE, 1976, 58 (02) : 341 - 348CHUNG, YWSIEKHAUS, WSOMORJAI, GA
- [23] AUGER-ELECTRON-SPECTROSCOPY ANALYSIS OF A PLASMON LOSS IN PALLADIUM SILICIDE FORMED FROM PD DEPOSITS ON SILICONPHYSICAL REVIEW B, 1987, 36 (14): : 7422 - 7427ANTON, RNEUKIRCH, UHARSDORFF, M
- [24] COMBINED LOW-ENERGY ELECTRON-DIFFRACTION AND AUGER-ELECTRON SPECTROSCOPY STUDIES OF INAS SURFACESJOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (02): : 911 - &GRANT, JT
- [25] SILICON DETECTOR FOR LOW-ENERGY ELECTRON-SPECTROSCOPYREVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (05): : 1464 - 1467DANESHVAR, KAITKEN, RGSINGCO, G
- [26] AUGER-ELECTRON SPECTROSCOPY, ELECTRON LOSS SPECTROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION OF OXYGEN AND CARBON-MONOXIDE ADSORPTION ON PD FILMSSCANNING ELECTRON MICROSCOPY, 1983, : 1635 - 1641VOOK, RWDECOOMAN, BCVANKAR, VD
- [27] Theory of inelastic processes in low-energy electron-loss spectroscopy. II. The optical potentialPHYSICAL REVIEW B-SOLID STATE, 1970, 2 (09): : 3457 - 3462Gersten, Joel I.
- [28] THE ROOM-TEMPERATURE OXIDATION OF CU/SI(100) AND CU/SI(111) INTERFACES STUDIED BY AUGER-ELECTRON SPECTROSCOPY, ELECTRON ENERGY-LOSS SPECTROSCOPY, AND HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPYJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 996 - 1002MOLLER, PJHE, JW
- [29] AUGER-ELECTRON SPECTROSCOPY AND LOW-ENERGY ELECTRON LOSS SPECTROSCOPY INVESTIGATIONS OF PLASMA-NITRIDED THIN THERMAL SIO2 AND NATIVE OXIDE ON SILICONTHIN SOLID FILMS, 1991, 202 (02) : 267 - 282ATANASSOVA, EDSHOPOV, AV
- [30] RETRACTABLE, REAR VIEWING LOW-ENERGY ELECTRON DIFFRACTION-AUGER SPECTROSCOPY SYSTEMREVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (02): : 255 - 258WENDELKEN, JFWITHROW, SPHERRELL, PS