首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
APPLICATION OF A UNIVERSAL CUSTOM DESIGNED INTEGRATED-CIRCUIT FOR IMPLANTS FOR FES
被引:0
|
作者
:
STOEHR, H
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
STOEHR, H
[
1
]
MAYR, W
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
MAYR, W
[
1
]
SCHWANDA, G
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
SCHWANDA, G
[
1
]
THOMA, H
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
THOMA, H
[
1
]
机构
:
[1]
VIENNA UNIV,SURG 2 CLIN,A-1010 VIENNA,AUSTRIA
来源
:
ARTIFICIAL ORGANS
|
1987年
/ 11卷
/ 04期
关键词
:
D O I
:
暂无
中图分类号
:
R318 [生物医学工程];
学科分类号
:
0831 ;
摘要
:
引用
收藏
页码:340 / 340
页数:1
相关论文
共 50 条
[31]
METALLIZATION FOR INTEGRATED-CIRCUIT MANUFACTURING
JOSHI, RV
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA NATL LABS,MICROELECTR DIRECTORATE,DEPT ADV SILICON PROGRAMS,LIVERMORE,CA 94550
JOSHI, RV
BLEWER, RS
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA NATL LABS,MICROELECTR DIRECTORATE,DEPT ADV SILICON PROGRAMS,LIVERMORE,CA 94550
BLEWER, RS
MURARKA, S
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA NATL LABS,MICROELECTR DIRECTORATE,DEPT ADV SILICON PROGRAMS,LIVERMORE,CA 94550
MURARKA, S
MRS BULLETIN,
1995,
20
(11)
: 33
-
37
[32]
PHYSICS OF INTEGRATED-CIRCUIT LITHOGRAPHY
PICKAR, KA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL NO RES,OTTAWA,ONTARIO,CANADA
BELL NO RES,OTTAWA,ONTARIO,CANADA
PICKAR, KA
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY,
1976,
21
(05):
: 820
-
820
[33]
CMOS INTEGRATED-CIRCUIT RELIABILITY
SCHNABLE, GL
论文数:
0
引用数:
0
h-index:
0
SCHNABLE, GL
COMIZZOLI, RB
论文数:
0
引用数:
0
h-index:
0
COMIZZOLI, RB
MICROELECTRONICS RELIABILITY,
1981,
21
(01)
: 33
-
50
[34]
INTEGRATED-CIRCUIT VOLTAGE REFERENCE
REHMAN, MA
论文数:
0
引用数:
0
h-index:
0
REHMAN, MA
ELECTRONIC ENGINEERING,
1980,
52
(638):
: 65
-
&
[35]
NOISE IN INTEGRATED-CIRCUIT TRANSISTORS
BRODERSEN, AJ
论文数:
0
引用数:
0
h-index:
0
BRODERSEN, AJ
CHENETTE, ER
论文数:
0
引用数:
0
h-index:
0
CHENETTE, ER
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
JAEGER, RC
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1970,
SC 5
(02)
: 63
-
+
[36]
A MULTIFUNCTION MONOLITHIC INTEGRATED-CIRCUIT
ALLAMANDO, E
论文数:
0
引用数:
0
h-index:
0
ALLAMANDO, E
ONDE ELECTRIQUE,
1994,
74
(01):
: 58
-
63
[37]
MICROWAVE INTEGRATED-CIRCUIT TECHNIQUES
OXLEY, TH
论文数:
0
引用数:
0
h-index:
0
机构:
HIRST RES CTR,DEPT MICROWAVE COMPONENT,CENT RES LABS,MANCHESTER,ENGLAND
HIRST RES CTR,DEPT MICROWAVE COMPONENT,CENT RES LABS,MANCHESTER,ENGLAND
OXLEY, TH
GEC-JOURNAL OF SCIENCE & TECHNOLOGY,
1976,
43
(01):
: 21
-
31
[38]
A GUIDE TO INTEGRATED-CIRCUIT TECHNOLOGY
CAMENZIN.HR
论文数:
0
引用数:
0
h-index:
0
CAMENZIN.HR
ELECTRO-TECHNOLOGY,
1968,
81
(02):
: 49
-
&
[39]
MOS INTEGRATED-CIRCUIT RELIABILITY
SCHNABLE, GL
论文数:
0
引用数:
0
h-index:
0
SCHNABLE, GL
SCHLEGEL, ES
论文数:
0
引用数:
0
h-index:
0
SCHLEGEL, ES
EWALD, HJ
论文数:
0
引用数:
0
h-index:
0
EWALD, HJ
IEEE TRANSACTIONS ON RELIABILITY,
1972,
R 21
(01)
: 12
-
&
[40]
STATISTICAL INTEGRATED-CIRCUIT DESIGN
DIRECTOR, SW
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
DIRECTOR, SW
FELDMANN, P
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
FELDMANN, P
KRISHNA, K
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
KRISHNA, K
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1993,
28
(03)
: 193
-
202
←
1
2
3
4
5
→