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- [6] Separate measurement of geometrical thickness and refractive index by an interference confocal microscope ADVANCED PHOTONIC SENSORS AND APPLICATIONS, 1999, 3897 : 342 - 354
- [10] Wavelength scanning confocal interference microscope for separate measurement of refractive index and geometrical thickness OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99), 1999, 3740 : 30 - 33