670-NM ALGAINP GAINP STRAINED MULTIQUANTUM-WELL LASER-DIODE WITH HIGH CHARACTERISTIC TEMPERATURE (T(0))

被引:2
|
作者
KIM, JS
YANG, M
CHOI, WJ
CHANG, JH
CHO, IS
CHOI, WT
YOO, TK
机构
[1] LG Electronics Research Center, Seoul, 137-140, 16 Woomyeon-Dong, Seocho-Gu
关键词
D O I
10.1007/BF00563580
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 670 nm AlGalnP/GalnP strained multi-quantum well laser diode with a high characteristic temperature (T0) has been achieved by optimization of quantum well structures and the metal-organic chemical vapour deposition process. The hole concentration of 5 x 10(17) cm-3 in the p-AlGalnP cladding layer on a (100) 5-degrees off GaAs substrate has been obtained with very small ratio, 0.35, of mole flow rate of zinc source to the group III sources ([DEZn]/[III] of 0.35. The threshold current and maximum temperature for continuous wave operation of lasers with cavity length of 300 mum have been measured as 45 mA and 80-degrees-C, respectively. The characteristic temperature (T0) of the lasers has been measured as high as 153 K. The laser without facet protections could operate for more than 1000h at 50-degrees-C and 5 mW.
引用
收藏
页码:435 / 440
页数:6
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