MICROCIRCUIT TESTING AND FABRICATION, USING SCANNING ELECTRON-MICROSCOPES

被引：0

|

作者：

不详

机构：

来源：

SOLID STATE TECHNOLOGY | 1976年 / 19卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：43 / &

相关论文

共 50 条

[21] NEW ELECTRON-MICROSCOPES
不详
PATHOLOGIE BIOLOGIE, 1973, 21 (10): : 1153 - 1154
[22] MEASUREMENT OF LOCAL TEXTURES WITH TRANSMISSION AND SCANNING ELECTRON-MICROSCOPES
SCHWARZER, RA
TEXTURES AND MICROSTRUCTURES, 1990, 13 (01): : 15 - 30
[23] SCANNING ELECTRON-MICROSCOPES AND OTHER BEAM INSTRUMENTS FOR SPACEFLIGHT
ALBEE, AL
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 7 (02): : 137 - 137
[24] AUTOMATIZING ELECTRON-MICROSCOPES
VANDERMAST, KD
ULTRAMICROSCOPY, 1984, 14 (04) : 393 - 394
[25] PHOTOGRAMMETRIC SELF-CALIBRATION OF SCANNING ELECTRON-MICROSCOPES - SPIRAL DISTORTION COMPENSATION IS KEY TO ACCURATE 3-DIMENSIONAL MAPPING WITH SCANNING ELECTRON-MICROSCOPES
MAUNE, DF
PHOTOGRAMMETRIC ENGINEERING AND REMOTE SENSING, 1976, 42 (09): : 1161 - 1172
[26] DIGITAL MULTIPLE-STANDARD SYNCHROGENERATOR FOR SCANNING ELECTRON-MICROSCOPES
KOROLEV, GV
BALOBANOV, VG
KULYAS, OL
KAMALYAGIN, AA
DANILOV, AV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1982, 25 (05) : 1252 - 1255
[27] COMBINATION OF SCANNING TUNNEL AND RASTER ELECTRON-MICROSCOPES IN ONE DEVICE
VOLODIN, AP
KOPETSKII, CV
STEPANYAN, GA
KHAIKIN, MS
EDELMAN, VS
PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1987, 13 (20): : 1251 - 1255
[28] COMPUTERS AND ELECTRON-MICROSCOPES
EADES, JA
ULTRAMICROSCOPY, 1988, 24 (01) : R5 - R6
[29] FIELD-EMISSION CATHODES FOR CWIKSCAN SCANNING ELECTRON-MICROSCOPES
KHATAPOVA, RM
ROMANOVA, VK
DEMSKAYA, LL
GUSHCHIN, VA
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1985, 28 (03) : 727 - 728
[30] OBSERVATION OF GRAPHITE STRUCTURE UNDER OPTICAL AND SCANNING ELECTRON-MICROSCOPES
NARENDRANATH, CS
ROHATGI, PK
YEGNESWARAN, AH
JOURNAL OF MATERIALS SCIENCE LETTERS, 1986, 5 (06) : 592 - 594

← 1 2 3 4 5 →