NANOSECOND HARD X-RAY SOURCE FOR TIME-RESOLVED X-RAY-DIFFRACTION STUDIES

被引：33
|
作者：
TOMOV, IV
CHEN, P
RENTZEPIS, PM
机构：
[1] Department of Chemistry, University of California, Irvine
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 11期
关键词：
D O I：
10.1063/1.1146086
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We describe an optically driven x-ray diode which can generate nanosecond, hard x-ray pulses at a repetition rate of 300 Hz, with high stability and a synchronization capability of 1-2 ns. The system is suitable for nanosecond time resolved diffraction experiments. Using this system diffraction patterns from liquids and polycrystalline solids were recorded. (C) 1995 American Institute of Physics.
引用
收藏
页码：5214 / 5217
页数：4
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