Time-resolved reflection surface x-ray diffraction

被引：8
|
作者：
Hong, HW
Wu, Z
Chiang, TC
Zschack, P
Chen, HD
机构：
[1] Univ Illinois, Fredrick Seitz Mat Res Lab, Argonne, IL 60439 USA
[2] Univ Illinois, Fredrick Seitz Mat Res Lab, Urbana, IL 61801 USA
[3] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA
[4] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2002年 / 73卷 / 04期
关键词：
D O I：
10.1063/1.1435823
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Methods to collect two-dimensional time-resolved x-ray diffraction patterns from surfaces/interfaces were developed. Reflection surface x-ray diffraction utilizing high brilliance x rays and a charge coupled device can achieve a time resolution as good as one second. Also, two-dimensional maps of reflectivity rocking curves can be recorded fast enough to monitor growth processes. These methods were demonstrated for the study of Ag and Pb films on Si (111)-(7x7) surfaces. (C) 2002 American Institute of Physics.
引用
收藏
页码：1720 / 1723
页数：4
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