RAPID THERMAL-PROCESSING OF HIGH-QUALITY SILICON DIOXIDE FILMS

被引:0
|
作者
NULMAN, J
机构
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:189 / 191
页数:3
相关论文
共 50 条
  • [41] EFFECTS OF RAPID THERMAL-PROCESSING ON THE QUALITY OF 7 NM GATE OXIDES
    ANGELUCCI, R
    SUN, YC
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) : C123 - C123
  • [43] INFLUENCE OF RAPID THERMAL-PROCESSING ON MINORITY-CARRIER DIFFUSION LENGTH IN SILICON
    EICHAMMER, WA
    VU, TQ
    SIFFERT, P
    [J]. RAPID THERMAL ANNEALING / CHEMICAL VAPOR DEPOSITION AND INTEGRATED PROCESSING, 1989, 146 : 185 - 190
  • [44] SHALLOW JUNCTION FORMATION BY MEANS OF RAPID THERMAL-PROCESSING OF DOPED GLASS ON SILICON
    DESOUZA, JP
    HASENACK, CM
    SWART, JW
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (11) : C627 - C627
  • [45] RAPID THERMAL NITRIDATION OF THIN SILICON DIOXIDE FILMS
    HENSCHEID, D
    KOZICKI, MN
    SHEETS, GW
    GRAHAM, RJ
    MUGHAL, M
    ZWIEBEL, I
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1988, 17 (04) : S34 - S34
  • [46] SILICON TEMPERATURE-MEASUREMENT BY INFRARED TRANSMISSION FOR RAPID THERMAL-PROCESSING APPLICATIONS
    STURM, JC
    SCHWARTZ, PV
    GARONE, PM
    [J]. APPLIED PHYSICS LETTERS, 1990, 56 (10) : 961 - 963
  • [47] PROCESSING HIGH-QUALITY SILICON FOR MICROSTRIP DETECTORS
    NAVA, F
    OTTAVIANI, G
    TONINI, R
    FRABBONI, S
    QUARANTA, AA
    CANTONI, P
    FRABETTI, PL
    STAGNI, L
    QUEIROLO, G
    MANFREDI, PF
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 1992, 32 (1-3) : 366 - 371
  • [48] THE FORMATION OF CUINSE2 THIN-FILMS BY RAPID THERMAL-PROCESSING
    MOONEY, GD
    HERMANN, AM
    TUTTLE, JR
    ALBIN, DS
    NOUFI, R
    [J]. SOLAR CELLS, 1991, 30 (1-4): : 69 - 77
  • [49] SURFACE MICROSTRUCTURE OF CIS THIN-FILMS PRODUCED BY RAPID THERMAL-PROCESSING
    RIEDL, W
    RIMMASCH, J
    PROBST, V
    KARG, F
    GUCKENBERGER, R
    [J]. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1994, 35 (1-4) : 129 - 139
  • [50] RAPID THERMAL-PROCESSING OF TIN AND TISI2 FILMS FOR VLSI APPLICATIONS
    COHEN, B
    NULMAN, J
    HERMAN, M
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) : C125 - C125