SPECTRAL FAULT SIGNATURES FOR SINGLE STUCK-AT FAULTS IN COMBINATIONAL-NETWORKS

被引:26
|
作者
MILLER, DM [1 ]
MUZIO, JC [1 ]
机构
[1] UNIV VICTORIA,DEPT COMP SCI,VICTORIA V8W 2Y2,BC,CANADA
关键词
D O I
10.1109/TC.1984.5009369
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:765 / 769
页数:5
相关论文
共 50 条
  • [11] DESIGN OF TOTALLY FAULT LOCATABLE COMBINATIONAL-NETWORKS
    GOUNDAN, A
    HAYES, JP
    IEEE TRANSACTIONS ON COMPUTERS, 1980, 29 (01) : 33 - 44
  • [12] Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns
    Schat, Jan
    2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS, 2008, : 235 - 240
  • [13] ANOMALOUS EFFECT OF A STUCK-AT FAULT IN A COMBINATIONAL LOGIC-CIRCUIT
    BHATTACHARYA, BB
    GUPTA, B
    PROCEEDINGS OF THE IEEE, 1983, 71 (06) : 779 - 780
  • [14] Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault
    Higami, Yoshinobu
    Inamoto, Tsutomu
    Wang, Senling
    Takahashi, Hiroshi
    Saluja, Kewal K.
    2024 INTERNATIONAL TECHNICAL CONFERENCE ON CIRCUITS/SYSTEMS, COMPUTERS, AND COMMUNICATIONS, ITC-CSCC 2024, 2024,
  • [15] Stuck-at tuple-detection: A fault model based on stuck-at faults for improved defect coverage
    Pomeranz, I
    Reddy, SM
    16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 289 - 294
  • [16] MULTISTEP FAULT-COLLAPSING METHOD FOR SPECTRAL SIGNATURE DETECTING IN COMBINATIONAL-NETWORKS
    WU, T
    ZHANG, YS
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1990, 68 (05) : 647 - 655
  • [17] Diagnosis of stuck-at faults in multistage interconnection networks
    Das, S.
    Chaudhuri, A.
    Journal of the Institution of Engineers (India), Part CP: Computer Engineering Division, 1994, 75
  • [18] Testing Multiple Stuck-at Faults of ROBDD Based Combinational Circuit Design
    Shah, Toral
    Matrosova, Anzhela
    Kumar, Binod
    Fujita, Masahiro
    Singh, Virendra
    2017 18TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS 2017), 2017,
  • [19] Machine Learning Based Fault Diagnosis for Stuck-at Faults and Bridging Faults
    Higami, Yoshinobu
    Yamauchi, Takaya
    Inamoto, Tsutomu
    Wang, Senling
    Takahashi, Hiroshi
    Saluja, Kewal K.
    2022 37TH INTERNATIONAL TECHNICAL CONFERENCE ON CIRCUITS/SYSTEMS, COMPUTERS AND COMMUNICATIONS (ITC-CSCC 2022), 2022, : 477 - 480
  • [20] DETECTION OF ALL SINGLE AND MULTIPLE STUCK-AT FAULTS IN COMBINATIONAL DIGITAL CIRCUITS USING INDEX VECTOR TESTING
    SENGUPTA, I
    INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE, 1990, 21 (08) : 1489 - 1502