CONFERENCE REPORT - THE 34TH RELIABILITY AND MAINTAINABILITY SYMPOSIUM

被引：0
|
作者：
JACOBS, RM
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1988年 / 28卷 / 04期
关键词：
D O I：
10.1016/0026-2714(88)90131-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：507 / 509
页数：3
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