CONFERENCE REPORT - THE 34TH RELIABILITY AND MAINTAINABILITY SYMPOSIUM

被引：0

|

作者：

JACOBS, RM

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1988年 / 28卷 / 04期

关键词：

D O I：

10.1016/0026-2714(88)90131-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：507 / 509

页数：3

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