CONFERENCE REPORT - 20TH ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM

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作者：

WEBSTER, LR

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MICROELECTRONICS AND RELIABILITY | 1974年 / 13卷 / 03期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页码：157 / 159

页数：3

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