共 50 条
- [31] THEORETICAL AND EXPERIMENTAL-STUDY OF X-RAY ACOUSTIC-RESONANCE IN PERFECT SILICON-CRYSTALSPHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1978, 90 (02): : 575 - 584ENTIN, IR
- [32] Plasmons in Liquid Rb at Elevated Temperatures Studied by Inelastic X-ray ScatteringJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2018, 87 (08)Hagiya, ToruMatsuda, KazuhiroHiraoka, NozomuHayashi, HiroyukiKimura, KojiKajihara, YukioInui, Masanori
- [33] EXAMINATION OF SURFACE-ROUGHNESS OF SILICON-CRYSTALS BY DOUBLE-CRYSTAL X-RAY TOPOGRAPHYJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (06): : 1113 - 1114NIWANO, MKOBAYASHI, TMIYAMOTO, N
- [34] CHANGE OF DISLOCATION MOBILITY CHARACTERISTICS IN SILICON SINGLE-CRYSTALS AT ELEVATED-TEMPERATURESPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1982, 73 (01): : K141 - K144FARBER, BYNIKITENKO, VI
- [35] DYNAMIC DEFORMATION OF SILICON-RICH V3SI SINGLE-CRYSTALS AT ELEVATED-TEMPERATURESCRYSTAL RESEARCH AND TECHNOLOGY, 1981, 16 (01) : 89 - 93BERTRAM, MPAUFLER, PKLEINSTUCK, K
- [36] X-ray Compton scattering from aluminium and silicon crystals at low scattering anglesJOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 : 889 - 892Yamada, MHida, M
- [37] X-ray Compton scattering from aluminum and silicon crystals at low scattering angles J Appl Crystallogr, pt 6 (889):
- [38] X-RAY DETERMINATION OF LATTICE PARAMETERS OF POTASSIUM DIHYDROGEN PHOSPHATE AT ELEVATED TEMPERATURESACTA CRYSTALLOGRAPHICA, 1967, 22 : 438 - +SIRDESHMUKH, DBDESHPANDE, VT
- [39] PRECISE RELATIVE X-RAY-MEASUREMENT OF THE LATTICE-PARAMETER OF SILICON-CRYSTALS WITH GROWTH STRIATIONSJOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 : 245 - 251KUBENA, JHOLY, V
- [40] APPLICATIONS OF X-RAY TRIPLE CRYSTAL DIFFRACTOMETRY TO STUDIES ON THE DIFFUSION-INDUCED DEFECTS IN SILICON-CRYSTALSPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1979, 54 (02): : 701 - 706IIDA, A