SHALLOW APPLICATIONS OF GEOPHYSICAL DIFFRACTION TOMOGRAPHY

被引：35
|
作者：
WITTEN, AJ [1 ]
LONG, E [1 ]
机构：
[1] OAK RIDGE NATL LAB,DIV COMP & TELECOMMUN,OAK RIDGE,TN 37831
来源：
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING | 1986年 / 24卷 / 05期
关键词：
D O I：
10.1109/TGRS.1986.289611
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
引用
收藏
页码：654 / 662
页数：9
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