CONTOURING BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY EMPLOYING DIVERGENT DUAL-BEAM ILLUMINATION

被引：5
|
作者：
ZOU, Y
PEDRINI, G
TIZIANI, H
机构：
[1] University of Stuttgart, Institute of Applied Optics, Stuttgart, 70569
来源：
JOURNAL OF MODERN OPTICS | 1994年 / 41卷 / 08期
关键词：
D O I：
10.1080/09500349414552471
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
For contouring of large object surfaces by means of electronic speckle pattern interferometry divergent illuminations were used. A method to shift dual illumination beams was employed to obtain contour fringes. The relationship between the fringes and object depth does not have the same form as in the case of collimated illuminations. It shows that the original measurement data can be corrected. Theoretical analysis and experimental results are presented which are in agreement with each other.
引用
收藏
页码：1637 / 1652
页数：16
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