CONTOURING BY MODIFIED DUAL-BEAM ESPI BASED ON TILTING ILLUMINATION BEAMS

被引：0
|
作者：
PENG, X
DIAO, HY
ZOU, YL
TIZIANI, H
机构：
来源：
OPTIK | 1992年 / 90卷 / 02期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new contouring method by modified dual-beam electronic speckle pattern interferometry is proposed. Instead of tilting test object as used in previous single wavelength techniques by ESPI, we introduce a tilt to the illuminating beams in order to obtain the contour fringe patterns. The most attractive feature of this technique is the possibility of contouring a stationary object so that it would be a more promising method in practical engineering metrology. The theoretical and experimental results show good agreement.
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页码：61 / 64
页数：4
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