STRUCTURE AND DYNAMICS OF STRONG CHEMISORPTION ON SI(111) AS MEASURED WITH ATOMIC HELIUM SCATTERING

被引:18
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DOAK, RB
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10.1116/1.584470
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:1252 / 1259
页数:8
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