ANOMALOUS MIGRATION OF ION-IMPLANTED AL IN SI

被引:23
|
作者
DIETRICH, HB [1 ]
WEISENBERGER, WH [1 ]
COMAS, J [1 ]
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
关键词
D O I
10.1063/1.88716
中图分类号
O59 [应用物理学];
学科分类号
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页码:182 / 184
页数:3
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