AGING RENEWAL PROCESS CHARACTERIZATIONS OF EXPONENTIAL-DISTRIBUTIONS

被引：5

作者：

BHATTACHARJEE, MC

机构：

[1] Center for Applied Mathematics and Statistics, Department of Mathematics, New Jersey Institute of Technology, Newark

来源：

MICROELECTRONICS AND RELIABILITY | 1993年 / 33卷 / 14期

关键词：

Electronic equipment - Failure analysis - Probability - Repair;

D O I：

10.1016/0026-2714(93)90006-K

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We consider some characterizations of exponentials among distributions driving certain aging renewal processes. The necessary and sufficient conditions so considered are in terms of the operating characteristics of perfect repair (renewal) and minimal repair strategies for equipments with NBU and NBUE aging life distributions.

引用

页码：2143 / 2147

页数：5

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