A NEW FAULT INDEPENDENT TEST-GENERATION ALGORITHM FOR COMBINATIONAL LOGIC-CIRCUITS

被引：2

作者：

OSMAN, MY ^{[1
]}

ALDEEB, MM ^{[1
]}

机构：

[1] KING FAHD UNIV PETR & MINERALS,DEPT INFORMAT & COMP SCI,DHAHRAN 31261,SAUDI ARABIA

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1992年 / 73卷 / 06期

关键词：

D O I：

10.1080/00207219208925802

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In order to improve the performance of fault independent test generation algorithms, two strategies are proposed: a critical lines maximization strategy (CLM) and a critical primary inputs flipping strategy (CPF). CLM is used to maximize the number of detected faults while generating a test pattern. CPF is used to derive new test pattern(s) from a generated test pattern with little additional effort. A new fault independent test generation algorithm (MAX) based on these strategies is introduced and illustrated.

引用

页码：1321 / 1337

页数：17

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