PRECISE DIELECTRIC MEASUREMENTS OF LOW-LOSS MATERIALS AT MILLIMETER AND SUBMILLIMETER WAVELENGTHS

被引：1

作者：

AFSAR, MN ^{[1
]}

CHANTRY, GW ^{[1
]}

机构：

[1] NATL PHYS LAB,DIV ELECT SCI,TEDDINGTON TW11 OLW,MIDDLESEX,ENGLAND

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1977年 / 25卷 / 06期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：508 / 511

页数：4

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